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Electron Microscope
TEM
SEM
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Electron Microscope
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FEG Multi Beam System
JIB-PS500i
120KV Compact TEM
JEM-120i
200KV High Throughput FEG TEM
JEM-ACE200F
Monochromated ARM200F
Monochromated ARM200F
200KV Atomic Resolution Transmission Electron Microscope
JEM-ARM200F NEO ARM
300KV Atomic Resolution Transmission Electron Microscope
JEM-ARM300F2 Grand ARM2
200KV Cold Field Emission Cryo-Electron Microscope
JEM-Z200FSC CRYO ARM™ 200
300KV Cold Field Emission Cryo-Electron Microscope
JEM-Z300FSC CRYO ARM™ 300
200KV FEG Multipurpose Analytical S/TEM
JEM-F200
200KV LaB6 Transmission Electron Microscope
JEM-2100Plus
120KV High Contrast Transmission Electron Microscope
JEM-1400 Flash
Schottky Thermal Field Emission Scanning Electron Microscope
JSM-IT810
Schottky Thermal Field Emission Scanning Electron Microscope
JSM-IT710HR InTouchScope
InTouchScope
JSM-IT510LV InTouchScope
InTouchScope
JSM-IT210 InTouchScope
NeoScope Benchtop SEM
JCM-7000
Field Emission Electron Probe Microanalyzer
JXA-iHP200F
W/LaB6 Electron Probe Microanalyzer
JXA-iSP100
FEG Multi Beam System
JIB-4700F
JEOL/Japan
GATAN Inc. /U.S.A.
Oxford Instruments/U. K.
SPI Supplies/U. S. A.
tousimis/U. S. A.
System in Frontier Inc /Japan
Nanomegas/Belgium
Micro Support Co.,Ltd/Japan
Protochips Inc/U.S.A.
Deben UK Ltd.