200KV Atomic Resolution Transmission Electron Microscope
Model:JEM-ARM200F NEO ARM Spec:200KV Cs Cold FEG File (PDF):Not yet uploaded Partner:JEOL Feature: * 200KV ultra high resolution image * Cold field emission gun with low chromatic aberration * Advanced STEM corrector (ASCOR) suppresses six-fold astigmatism * Integrated COSMO auto tune interface * Perfect sight NEO detector brings higher STEM signal at all acceleration voltages * Dedicated ABF detector * e-ABF real-time signal processing design enhanced contrast of light atoms * STEM system for scanning transmission image as standard(4 signal simultaneous acquisition is possible) * Bright field STEM detector as standard * Standard HAADF detector(option for other detection angle HAADF detector) * Option BEI detector * Viewing Camera system that Sample search and microscope alignment by PC * Lorentz lens setting integrated for magnetic domain observation in material * Select Area Diffraction * Ultra high spatial resolution for EDS, NBD and CBD
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