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Surface Analyzer
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Auger Analysis
Electron Microscope
Surface Analyzer
EM Analyzer
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Field Emission Auger Microscope
Model:
JAMP-9510F
Spec:
FEG 30KV UHV
File (PDF):
Not yet uploaded
Partner:
JEOL
Feature:
Schottky type thermal field emission gun
30KV high resolution image and spatial resolution
High sensitivity for analysis
New ion gun for depth profile and charge neutralization.
Flexibility option for EDS, XPS
PC control interface
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