Home > Instruments > Surface Analyzer > Auger Analysis

Field Emission Auger Microscope


Model:JAMP-9510F
Spec:FEG 30KV UHV
File (PDF):Not yet uploaded
Partner:JEOL

Feature:

  • Schottky type thermal field emission gun
  • 30KV high resolution image and spatial resolution
  • High sensitivity for analysis
  • New ion gun for depth profile and charge neutralization.
  • Flexibility option for EDS, XPS 
  • PC control interface



[ Back ]
JEOL/Japan
GATAN Inc. /U.S.A.
Oxford Instruments/U. K.
SPI Supplies/U. S. A.
tousimis/U. S. A.
System in Frontier Inc /Japan
Nanomegas/Belgium
Micro Support Co.,Ltd/Japan
Protochips Inc/U.S.A.
Deben UK Ltd.