ULTIM MAX Infinity unlocks the Infinite potential of EDS analysis in the SEM with new value in 3 key application areas:

• The Ultimate solution for nano-characterisation and light element detection
   New Extreme II low noise electronics with guaranteed C resolution of ≤ 46 eV @50,000 cps
• The Ultimate solution for the most accurate analysis
   New Tru-Q® IQ with individual characterisation and optimisation of every detector for the most accurate AutoID, quantitative analysis and mapping 
• The Ultimate solution for high count rate mapping of micro-structures
    Automatically remove high count rate pulse pile-up artefacts for mapping in seconds that reflects real element variation