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Sample Preparation
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TEM sample pre-treatment
Electron Microscope
Surface Analyzer
EM Analyzer
Sample Preparation
EM Attachments
Software
Consumables
Ion Slicer
Model:
IB-09100IS
Spec:
Ar ion TEM
File (PDF):
Not yet uploaded
Partner:
JEOL
Features:
High efficiency Ar ion gun
High quality TEM pre-treatment
Fast preparation
Minimal surface damage
Inner CCD to monitor sample slicing
PC control interface
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