About
News
Instruments
Applications
Catalogue
Service
Application
Parts/Consumables
Contact
Lang
中文
English
Home
>
Instruments
>
Electron Microscope
>
TEM
>
Transmission Electron Microscope 200 kV
Electron Microscope
Surface Analyzer
EM Analyzer
Sample Preparation
EM Attachments
Software
Consumables
200KV High Throughput FEG TEM
Model:
JEM-ACE200F
Spec:
200KV TFEG
File (PDF):
Not yet uploaded
Partner:
JEOL
High throughput
Fast data acquisition by a combined use with automatic microscope tuning functions (TEM/STEM).
Short specimen-holder pre-evacuation period enables quick start of observation within 30 sec from the time of holder insertion.
User-friendly interface
Sophisticated GUI based on daily microscope operation.
All of the operations can be covered by mouse operation.
Recipes for easy programming and changing
The recipe of workflow can be programmed with intuitively designed tools.
The workflow can be flexibly programmed using a variety of standardized programming languages.
Environmental-friendly design
Adoption of a highly environmental resistance enclosure.
Remote operation.
[
Back
]
JEOL/Japan
GATAN Inc. /U.S.A.
Oxford Instruments/U. K.
SPI Supplies/U. S. A.
tousimis/U. S. A.
System in Frontier Inc /Japan
Nanomegas/Belgium
Micro Support Co.,Ltd/Japan
Protochips Inc/U.S.A.
Deben UK Ltd.