300KV Atomic Resolution Transmission Electron Microscope
Model:JEM-ARM300F2 Grand ARM2 Spec:FETEM Cs File (PDF):Not yet uploaded Partner:JEOL Features 1. FHP2 newly developed objective lens pole-pieceThe FHP objective lens pole piece is optimized for ultrahigh spatial resolution observation. 2. New enclosureThe TEM column is covered by a box-type enclosure, which can reduce the effect of environmental changes such as temperature, air flow, acoustic noise and so on, and then it improves the stability of microscope. 3. ETA corrector & JEOL COSMO™ Quick & Accurate aberration correctionJEOL COSMO™ uses only 2 Ronchigrams acquired from any amorphous area to measure and correct aberrations. 4. Improvement of stabilityNew CFEG (Cold Field Emission electron Gun) adopted a smaller SIP with a larger evacuation volume than before for GRAND ARM™2. Enhancement of evacuation volume of SIP improves the degree of vacuum near the emitter inside CFEG, and also improves the stability of emission and probe currents. The miniaturization of SIP can reduce the total mass of CFEG by ~100 kg. Other improvements also enhance the stability and resistance to various disturbance for the microscope. |