型號：JEM-ARM300F Grand ARM
- Ultra high resolution imaging
Achieves a resolution of 63 pm in the scanning transmission electron microscope image (STEM) mode at an accelerating voltage of 300 kV, using JEOL's own spherical aberration corrector for the illumination system.
- High performance cold-cathode field-emission electron gun featuring high brightness and low energy dispersion
Incorporates a new high performance cold cathode electron gun as standard; the high brightness beam with minimum chromatic aberration allows for high resolution imaging and analysis.
- Wide accelerating voltage range
Supports accelerating voltage levels of 300 kV and 80 kV as standard; other accelerating voltage levels are optionally available as needed.
- Aberration corrector integrated with microscope base unit
Incorporates JEOL's proprietary spherical aberration correctors in the image forming system (TEM aberration corrector) and in the illumination system (STEM spherical aberration corrector).
- Aberration corrector control system
Uses the JEOL COSMO (JEOL Corrector System Module) system for auto control of the aberration correctors.
- Two types of objective lens pole piece
Two types of objective lens pole piece are available to meet a wide range of users' applications.
- Vacuum system featuring dry pre-evacuation and high vacuum
The vacuum system features a pre-evacuation system incorporating a turbo molecular pump as standard and an enhanced column evacuation system, achieving higher vacuum while minimizing contamination and damage in atomic level imaging and analysis.
- Stable column/console, specimen stage, and electrical system
The column, 330 mm in diameter, features a higher level of mechanical rigidity. The microscope base unit is also designed to enhance its mechanical/electrical stability and resistance to environment, fully utilizing the stabilizing technologies developed for the JEM-ARM200F.
- A complete line of signal detectors
A complete line of signal detectors are available, including EDS (energy dispersive X-ray spectrometer) up to 100 mm2 and EELS (electron energy loss spectrometer), backscattered electron detectors, and up to 4 STEM detectors. The microscope also supports simultaneous observation of high angle annular dark field image, low angle annular dark field image, annular bright field image and bright field image.