About
News
Instruments
Applications
Catalogue
Service
Application
Parts/Consumables
Contact
Lang
中文
English
Home
>
Instruments
>
Electron Microscope
>
EPMA
>
FE-EPMA
Electron Microscope
Surface Analyzer
EM Analyzer
Sample Preparation
EM Attachments
Software
Consumables
Field Emission Electron Probe Microanalyzer
Model:
JXA-iHP200F
Spec:
Schottky Thermal FEG EPMA EDS WDS
File (PDF):
Not yet uploaded
Partner:
JEOL
Feature:
In-lens Shottcky type thermal field emission gun
30 KV ultra high resolution image
Improved resolution at high probe current
High stability for a long period of time
Miscellaneous crystal for different requirement
Automatic serial analysis
Excellent EDS and WDS geometry
Different method for Quantitative analysis
Rough surface analysis
Auto particle analysis
PC operation interface
[
Back
]
JEOL/Japan
GATAN Inc. /U.S.A.
Oxford Instruments/U. K.
SPI Supplies/U. S. A.
tousimis/U. S. A.
System in Frontier Inc /Japan
Nanomegas/Belgium
Micro Support Co.,Ltd/Japan
Protochips Inc/U.S.A.
Deben UK Ltd.