Home > Instruments > Electron Microscope > SEM > W/LaB6-SEM

InTouchScope


Model:JSM-IT200 InTouchScope
Spec:W/LaB6
File (PDF):Not yet uploaded
Partner:JEOL

JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScopeTM, with significantly higher throughput.
Specimen Exchange Navi, a beginner-friendly function, offers guided operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis”*2 for real time display of elemental analysis results, SMILE VIEW(TM) Lab for seamless report generation of observation and/or analysis results, etc., provide fast analysis with integrated transition from OM to SEM.
Fast observation, analysis and report generation!
JEOL InTouchScope™ series, the high performance analytical tool with major three functions.

 

  • Specimen Exchange Navi: Guided operation from sample introduction to observation
  • Fast observation! "Zeromag"
  • Fast analysis! "Live Analysis"*2
  • Fast report generation! SMILE VIEW™ Lab: integrated data management



[ Back ]
JEOL/Japan
GATAN Inc. /U.S.A.
Oxford Instruments/U. K.
SPI Supplies/U. S. A.
tousimis/U. S. A.
System in Frontier Inc /Japan
Nanomegas/Belgium
Micro Support Co.,Ltd/Japan
Protochips Inc/U.S.A.
Deben UK Ltd.