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Dual/Multi Beam FIB
Electron Microscope > FIB


FEG Multi Beam System
JIB-PS500i
FEG Multi Beam System
JIB-4700F
JEOL/Japan
GATAN Inc. /U.S.A.
Oxford Instruments/U. K.
SPI Supplies/U. S. A.
tousimis/U. S. A.
System in Frontier Inc /Japan
Nanomegas/Belgium
Micro Support Co.,Ltd/Japan
Protochips Inc/U.S.A.
Deben UK Ltd.
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