規格：FESEM FIB Dual beam Schottky Thermal Field Emission
- High resolution SEM observation
Guaranteed resolution of 1.6 nm at a low accelerating voltage of 1 kV is delivered by a field-free hybrid objective lens, GB mode and in-lens detectors.
- Fast analysis
Rapid analysis is enabled because high resolution can be maintained in analyses under large probe-current by the combination with an in-lens Schottky-FEG and the aperture angle control lens.
- High speed processing
The high-power Ga ion beam column enables rapid processing of specimens.
- Enhanced detection system
Simultaneous detection system involving the newly-developed in-lens detectors allows for real-time observation of images from up to 4 detectors.
The JIB-4700F is compatible with a variety of optional attachments including EDS, EBSD, cryo-transfer systems, cooling stages and air-isolated transfer systems, etc.
- Three-dimensional observation/analysis
Three-dimensional visualization of images and analysis data is possible by the combination of high-resolution SEM and appropriate optional analysis unit(s).
- Compatible transfer solutions
TEM grids can be easily attached to a retainer that can be mounted to the TEM or FIB holder. Hence, lamella can be easily prepared, STEM-imaged and analyzed in the FIB system and transferred to the TEM afterwards.
- Picture overlay system
This intuitive software enables image overlay across various microscope platforms. Images acquired in light microscopes, SEMs or TEMs can be used for navigation in the FIB system and vice versa.