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四維掃描穿透電子繞射系統


型號:STEMx
規格:
技術文件:尚未上傳
廠商:Gatan

Features 

Introducing STEMx™, a 4D STEM diffraction system that collects data through hardware synchronization with Gatan’s in-situ cameras. By leveraging the high spatial and temporal resolution of the K2® IS, OneView® IS, and Rio™ IS cameras, STEMx enables a wide variety of 4D STEM experiments, including strain mapping, indexing, orientation mapping, virtual apertures, and differential phase contrast.

  • Leverage your existing Gatan in-situ camera for new 4D STEM applications
  • Scan large sample areas with high diffraction space resolution
  • Streamline your workflow for advanced applications
  • Examine preliminary results in <10 min

Once a diffraction pattern is generated for each data point, a single, interactive Gatan Microscopy Suite® (GMS) 3 display enables you to view and manipulate all the information in a 4D STEM diffraction cube; including diffraction planes or individual diffraction patterns at each pixel location. STEMx is then able to process these large datasets within minutes using data size reduction methods that comprise of binning in four dimensions, sub-sampling in the spatial domain, or selecting a small region of interest. By consolidating both acquisition and analysis into GMS 3, not only can you quickly analyze and assess results at the microscope, but immediately decide whether to modify acquisition parameters or capture a new dataset.



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