200KV 單光型原子解析場發射穿透式電子顯微鏡
型號:Monochromated ARM200F 規格: 技術文件:尚未上傳 廠商:JEOL Double Wien-filter monochromator for JEM-ARM200F is newly developed to realize ultra high energy resolution EELS analysis at atomic-scale. • Double Wien-filter "Spot-IN and Spot-Out system"The 1st Wien-filter and the electro-static lens produces a focus with energy dispersion of 12.3 μm/eV at the slit plane. At this plane, the electron beam is monochromated by inserting the slit of several widths ranging from few microns to sub microns. The 2nd Wien-filter cancels the energy-dispersion and produces an achromatic and stigmatic focus at exit plane, resulting in the roundly probe on the specimen plane. Thus, since a spot beam from Schottky source becomes a spot again at the exit after the monochromation, we named this monochromator system "Spot-IN and Spot-OUT system". • Sophisticated Octopole Wien-filterThe sophisticated Octopole Wien-filter produces homogeneous dipole field with no undesireble hexapole field from inhomogeneity of dipole field. • Arranged between Schottky source and acceleratorWith a preset monochromator setting works universally on every accelerating voltages, since the accelerator is located after the monochromator and axial potential of the monochromator is kept constant. |