Features

JEM-2800 is a versatile TEM/STEM that offers superior usability, while simultaneously achieving high-resolution, high throughput and highly sensitive analysis.

1. Wide variety of observation modes, including SEM, suitable for any kind of specimen

2.Operating environment supported by Automation and Navigation

3.High speed analysis with the large area 100mm2 SDD (Dual SDD)

4.Data management system and report writing support tool